PIE-650M
Single Sheet Visual Inspection System
PIE-650M is a Single Sheet Visual Inspection System with the high speed scanning cameras (max. data rate: 850MHz) to detect any defects of a variety of single sheet such as metal foils, sheet steel, paper, unwoven, glass, laminate plates, resin, food and liquid crystal display. It performs the high precise inspection and user-friendly operation with Ikegami unique image processing technology.
Detecting defects with high-speed and high-definition helps to improve production quality.
The system can be flexibly configured between small-scale and large-scale system depending on customer’s demands.
Main Features
- Detecting a variety of defects with multiple lighting systems such as reflective and trans illumination.
- Multiple defects can be detected with one set of camera. This system can improve the efficiency of inspection.
- Min. defect size: 50 μm, Max. transfer speed: 100 m/min.
- User friendly operation (touch panel)
- Flexible customization (installation space, GUI), additional defects can be registered by arranging lighting system.
- Easy maintenance.
- Over 40 years of experience of inspection.
Failed Object Display
- Real-time display
Failed/defective objects can be displayed on screen in real-time. - Mapping display
Multiple objects can be displayed as a map, and each object can be switched for individual image view.
Object Images Listing Feature
- All images can be listed on display with the inspected data.
Even during the inspection, the simulated result report can be viewed.
Statistical Data Display
- Statistical data can be displayed as graphs and number.
Inspection result can be displayed as statistical data visually for understanding and analysis.
| Camera | Line sensor camera (6,000 - 16,000 pixels, 160 MHz - 850 MHz) |
|---|---|
| Lighting | Line-type LED etc. |
| Image Processing | 11 kinds of algorithm to detect defects, Maximum 200 defect types classification, defect-level, cycle / cluster level |
| Functions | Simulation, Defect mapping, Statics information viewing, Inspection history viewing, Waveform monitoring, Speed tracking, System log recording, etc. |
| Available objects | Films, Glasses, Metal foils, Laminate plates, Resin, Sheet steel, Unwoven, Rubber and Food, etc. |
| Detectable defects | Scratch, Dingy, Wrinkles, Uneven, Foreign matters, Unwanted lines, Streaks, Pin holes. |
| Weight | Depends on the system. |
| External Dimension | Depends on the system. |
| Power Source | Depends on the system. |
| Operate Environment | Temperature：10℃ to 35℃, Humidity：20% to 80%RH (Condensation must be avoided) |
| Option | External input/output control, Marking machine, Remote monitoring, Branching operation display, Offline verification application (checking log/defect simulation), CSV, etc. |
- Personal information is required
- Software
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